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BRidge4Net

Ethernet Test System for Highly Efficient Conversion of BroadR-Reach™ protocol

Highlights


For all BroadR-Reach equipped systems that require conversion to Ethernet

Customized software for easy debug and maintenance

Link error diagnosis

Easy-to-install and configure

Tech Specs

API

Compatible with LabVIEW™ / Teststand

Communication protocol
Ethernet PHY transceivers
PC

MDIO

USB

Power supply
Cable type/input
Voltage
Frequency
Current

 

DC barrel conector
9…36V DC

2A (max)

Input/Output

Conector Ethernet
Conector BroadR-Reach™

RJ45
Automotive Molex

Downloads

For additional information, contact Controlar at info@pt.controlar.com

Overview

BRidge4Net is a unique device in the market developed for converting 100BASE-TX (conventional Ethernet) to 100BASE-T1 (BroadR-Reach™ Ethernet).

Featuring link error diagnosis, it is the ideal option for all test systems applications in the automotive industry and/or ATE’s suppliers that require conversion to Ethernet. It integrates proprietary design and compact housing, resulting in an efficient, robust, and easy-to-install device.

Configuration

The stand-alone version is supplied inside a small box easy to integrate and connect to be used in the laboratory or bench.

The base version is supplied as a barebone PCB easy to integrate and connect to to be embedded in a JIG or test equipment.

With mounting holes and a flexible power input, both versions are simple to integrate. The power connector can be customized as requested within mechanical possibilities.

BRidge4Net configuration allows the reduction of cabling complexity, ensuring a quick and easy installation, debug and maintenance.

It can be redesigned to meet specific space constraints or any other specific need.

Main applications

The careful design of the BRidge4Net converter makes it best suited for integration of high-end test systems for the automotive industry, such as radars, infotainment, and rear/front camera test systems.

Examples include applications in climatic chambers; run-in, burn-in and any multi-DUT ATE, and In-Circuit Testing, Functional Testing and Flash Programming.

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