Accelerated Stress Test System
According to model and customer’s requirements
DC/AC voltage, current consumption, resistance and temperature.
Run-in Systems are industrial test systems prepared to perform run-in testing, i.e., accelerated stress on electronic equipment so that the critical initial period, with higher failure rate, happens within the production process and the probability of subsequent malfunction is reduced.
In this type of tests, the DUTs are placed in a JIG where they remain in operation in demanding conditions for a long period of time, to check for any change in the product characteristics.
Our compact Run-in Systems are configurable and may hold as many DUTs as requested by the customer. With (semi) automatic load of DUTs, these systems are also adaptable to both online and offline configurations.
- Test / Measurement Equipment use – PPS, DMM, CAN device, etc.
- Available in different versions: Compact, Multi-DUTs, Automatic or semi-automatic Load and with Multi and Combined Functionality (Run-in, Burn-in, download station)
Controlar Run-in Systems meet the high standards of the automotive industry, which makes them also suitable for other industries, such as consumer and industrial electronics, with the possibility of being customized for different types of products (easily scalable and highly modular).