Burn-in and Run-in Systems are industrial test systems prepared to perform burn-in and run-in testing, i.e., accelerated ageing or stress on electronic equipment so that the critical initial period, with higher failure rate, happens within the production process and the probability of subsequent malfunction is reduced.
In burn-in testing, DUTs are placed in a climate chamber or temperature-controlled modules where they remain in operation for a period of time. During this time, acquisition systems can perform functional tests or download software to monitor any changse in the product characteristics.
In run-in testing, the DUTs are placed in a JIG where they remain in operation under demanding conditions for a long period. This process also aims to identify any variations in the product’s characteristics.
Our compact Burn-in and Run-In Systems are configurable and may hold as many DUT as requested by the customer. With (semi) automatic load of DUTs, these systems are also adaptable to both in-line and off-line configurations.
Controlar Burn-in and Run-in Systems meet the high standards of the automotive industry, which makes them also suitable for other industries, such as consumer and industrial electronics, with the possibility of being customized for different types of products (easily scalable and highly modular).