The TSIM – Test System Intelligent Machine is a modular end-of-line platform for functional testing of electronic devices and components.
Its standard interface and Zero Force Quick ChangeOver concept allow test configurations to be adapted as products, technologies and production requirements evolve.
From PCB-level and complete-device testing to communication interfaces and RF validation, TSIM combines configurable instrumentation and interchangeable modules within a reusable platform. For wireless applications, the TSIM Wireless RF Shielded configuration integrates an anechoic chamber for functional RF testing of products with integrated antennas.
